Show simple item record

Origin of degradation in Si-based all-solid-state Li-ion microbatteries

dc.contributor.authorChen, Chunguang
dc.contributor.authorOudenhoven, Jos
dc.contributor.authorDanilov, Dmitri
dc.contributor.authorVezhlev, Egor
dc.contributor.authorGao, Lu
dc.contributor.authorLi, Na
dc.contributor.authorMulder, Fokko
dc.contributor.authorEichel, Rüdiger-A.
dc.contributor.authorNotten, Peter
dc.date.accessioned2021-10-25T17:10:51Z
dc.date.available2021-10-25T17:10:51Z
dc.date.issued2018
dc.identifier.issn1614-6840
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30398
dc.sourceIIOimport
dc.titleOrigin of degradation in Si-based all-solid-state Li-ion microbatteries
dc.typeJournal article
dc.contributor.imecauthorOudenhoven, Jos
dc.contributor.orcidimecOudenhoven, Jos::0000-0001-9824-3542
dc.source.peerreviewyes
dc.source.beginpage1801430
dc.source.journalAdvanced Energy Materials
dc.source.issue30
dc.source.volume8
dc.identifier.urlhttps://doi.org/10.1002/aenm.201801430
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record