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Developing silicon photonics technologies with a wafer-level test station

dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorBolt, Bryan
dc.date.accessioned2021-10-25T17:40:48Z
dc.date.available2021-10-25T17:40:48Z
dc.date.issued2018-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30519
dc.sourceIIOimport
dc.titleDeveloping silicon photonics technologies with a wafer-level test station
dc.typeJournal article
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.source.peerreviewno
dc.source.journalPhotonics Online
dc.identifier.urlhttps://www.photonicsonline.com/doc/developing-silicon-photonics-technologies-with-a-wafer-level-test-station-0001
imec.availabilityPublished - imec


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