dc.contributor.author | de Jamblinne de Meux, Albert | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Genoe, Jan | |
dc.contributor.author | Heremans, Paul | |
dc.date.accessioned | 2021-10-25T17:42:50Z | |
dc.date.available | 2021-10-25T17:42:50Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 2331-7019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30527 | |
dc.source | IIOimport | |
dc.title | Defects in amorphous semicondutors: the case of amorphous-Indium-Gallium-Zinc-Oxide | |
dc.type | Journal article | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Genoe, Jan | |
dc.contributor.imecauthor | Heremans, Paul | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Genoe, Jan::0000-0002-4019-5979 | |
dc.contributor.orcidimec | Heremans, Paul::0000-0003-2151-1718 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 54039 | |
dc.source.journal | Physical Review Applied | |
dc.source.issue | 5 | |
dc.source.volume | 9 | |
dc.identifier.url | https://link.aps.org/doi/10.1103/PhysRevApplied.9.054039 | |
imec.availability | Published - imec | |