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Deep learning for infrared thermal image based machine health monitoring

dc.contributor.authorJanssens, Olivier
dc.contributor.authorVandewalle, Rik
dc.contributor.authorLoccufier, Mia
dc.contributor.authorVan Hoecke, Sofie
dc.date.accessioned2021-10-25T20:21:04Z
dc.date.available2021-10-25T20:21:04Z
dc.date.issued2018-02
dc.identifier.issn1083-4435
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30963
dc.sourceIIOimport
dc.titleDeep learning for infrared thermal image based machine health monitoring
dc.typeJournal article
dc.contributor.imecauthorVandewalle, Rik
dc.contributor.imecauthorVan Hoecke, Sofie
dc.contributor.orcidimecVan Hoecke, Sofie::0000-0002-7865-6793
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage151
dc.source.endpage159
dc.source.journalIEEE/ASME Transactions on Mechatronics
dc.source.issue1
dc.source.volume23
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7967622/
imec.availabilityPublished - open access


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