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Advanced interconnect technology and reliability

dc.contributor.authorLi, Yunlong
dc.contributor.authorChao, Zhao
dc.date.accessioned2021-10-25T22:02:34Z
dc.date.available2021-10-25T22:02:34Z
dc.date.issued2018-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31181
dc.sourceIIOimport
dc.titleAdvanced interconnect technology and reliability
dc.typeBook chapter
dc.contributor.imecauthorLi, Yunlong
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.source.peerreviewno
dc.source.beginpage215
dc.source.bookCMOS Past, Present and Future
dc.source.endpage247
dc.identifier.urlwww.sciencedirect.com/science/book/9780081021392
imec.availabilityPublished - imec


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