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Identification of nickel-vacancy defects by combining experimental and ab initio simulated photocurrent spectra

dc.contributor.authorLondero, E.
dc.contributor.authorBourgeois, Emilie
dc.contributor.authorNesladek, Milos
dc.contributor.authorGalli, A.
dc.date.accessioned2021-10-25T22:25:55Z
dc.date.available2021-10-25T22:25:55Z
dc.date.issued2018
dc.identifier.issn1098-0121
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31226
dc.sourceIIOimport
dc.titleIdentification of nickel-vacancy defects by combining experimental and ab initio simulated photocurrent spectra
dc.typeJournal article
dc.contributor.imecauthorBourgeois, Emilie
dc.contributor.imecauthorNesladek, Milos
dc.contributor.orcidimecBourgeois, Emilie::0000-0002-3668-1202
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage241202
dc.source.journalPhysical Review B
dc.source.issue24
dc.source.volume97
dc.identifier.urlhttps://doi.org/10.1103/PhysRevB.97.241202
imec.availabilityPublished - open access


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