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A compact vibration reduced set-up for scanning nm-XRF and STXM

dc.contributor.authorLubeck, Janin
dc.contributor.authorSeim, Christian
dc.contributor.authorDehlinger, Aurelie
dc.contributor.authorHaidl, Andreas
dc.contributor.authorHoenicke, Philipp
dc.contributor.authorKayser, Yves
dc.contributor.authorUnterumsberger, Rainer
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorBeckhoff, Burkhard
dc.date.accessioned2021-10-25T22:35:41Z
dc.date.available2021-10-25T22:35:41Z
dc.date.issued2018
dc.identifier.issn1431-9276
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31244
dc.sourceIIOimport
dc.titleA compact vibration reduced set-up for scanning nm-XRF and STXM
dc.typeJournal article
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage158
dc.source.endpage161
dc.source.journalMicroscopy and Microanalysis
dc.source.issueSuppl. 2
dc.source.volume24
dc.identifier.urlhttps://doi.org/10.1017/S1431927618013181
imec.availabilityPublished - open access
imec.internalnotes14th International Conference on X-ray Microscopy (XRM2018)


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