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Performance of differential pair circuits designed with line tunnel FET devices at different temperatures

dc.contributor.authorMartino, Marcio
dc.contributor.authorMartino, Joao Antopnio
dc.contributor.authorAgopian, Paula
dc.contributor.authorRooyackers, Rita
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-25T23:08:27Z
dc.date.available2021-10-25T23:08:27Z
dc.date.issued2018
dc.identifier.issn0268-1242
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31306
dc.sourceIIOimport
dc.titlePerformance of differential pair circuits designed with line tunnel FET devices at different temperatures
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage075012-1
dc.source.endpage075012-6
dc.source.journalSemiconductor Science and Technology
dc.source.issue7
dc.source.volume33
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/1361-6641/aac4fd
imec.availabilityPublished - imec


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