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Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors

dc.contributor.authorOp de Beeck, Jonathan
dc.contributor.authorLabyedh, Nouha
dc.contributor.authorSepulveda Marquez, Alfonso
dc.contributor.authorSpampinato, Valentina
dc.contributor.authorFranquet, Alexis
dc.contributor.authorConard, Thierry
dc.contributor.authorVereecken, Philippe
dc.contributor.authorCelano, Umberto
dc.date.accessioned2021-10-26T00:26:47Z
dc.date.available2021-10-26T00:26:47Z
dc.date.issued2018
dc.identifier.issn2040-3364
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31450
dc.sourceIIOimport
dc.titleDirect imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors
dc.typeJournal article
dc.contributor.imecauthorOp de Beeck, Jonathan
dc.contributor.imecauthorLabyedh, Nouha
dc.contributor.imecauthorSepulveda Marquez, Alfonso
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVereecken, Philippe
dc.contributor.imecauthorCelano, Umberto
dc.contributor.orcidimecOp de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimecLabyedh, Nouha::0000-0002-1036-0988
dc.contributor.orcidimecSepulveda Marquez, Alfonso::0000-0003-4726-177X
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecVereecken, Philippe::0000-0003-4115-0075
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewyes
dc.source.beginpage12564
dc.source.endpage12572
dc.source.journalNanoscale
dc.source.issue26
dc.source.volume10
dc.identifier.urlhttp://pubs.rsc.org/en/content/articlelanding/2018/nr/c8nr02887g#!divAbstract
imec.availabilityPublished - imec


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