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DESTIN: A new approach to interconnect reliability testing

dc.contributor.authorWitvrouw, Ann
dc.contributor.authorBeyer, Gerald
dc.contributor.authorMaex, Karen
dc.contributor.authorTielemans, Luc
dc.date.accessioned2021-10-01T09:48:08Z
dc.date.available2021-10-01T09:48:08Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3155
dc.sourceIIOimport
dc.titleDESTIN: A new approach to interconnect reliability testing
dc.typeJournal article
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewno
dc.source.beginpage343
dc.source.endpage347
dc.source.journalSemiconductor Fabtech
dc.source.volume7
imec.availabilityPublished - imec


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