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dc.contributor.authorRoels, Joris
dc.contributor.authorAelterman, Jan
dc.contributor.authorLuong, Hiep
dc.contributor.authorLippens, Saskia
dc.contributor.authorPizurica, Aleksandra
dc.contributor.authorSaeys, Yvan
dc.contributor.authorPhilips, Wilfried
dc.date.accessioned2021-10-26T02:43:37Z
dc.date.available2021-10-26T02:43:37Z
dc.date.issued2018
dc.identifier.issn0022-2720
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31674
dc.sourceIIOimport
dc.titleAn overview of state-of-the-art image restoration in electron microscopy
dc.typeJournal article
dc.contributor.imecauthorAelterman, Jan
dc.contributor.imecauthorLuong, Hiep
dc.contributor.imecauthorPhilips, Wilfried
dc.contributor.orcidimecAelterman, Jan::0000-0002-5543-2631
dc.contributor.orcidimecLuong, Hiep::0000-0002-6246-5538
dc.contributor.orcidimecPhilips, Wilfried::0000-0003-4456-4353
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage239
dc.source.endpage254
dc.source.journalJournal of Microscopy
dc.source.issue3
dc.source.volume271
dc.identifier.urlhttps://onlinelibrary.wiley.com/doi/abs/10.1111/jmi.12716
imec.availabilityPublished - open access


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