Show simple item record

Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy

dc.contributor.authorZhang, Feng
dc.contributor.authorLiu, X.
dc.contributor.authorJin, S.
dc.contributor.authorBender, Hugo
dc.contributor.authorLou, N. Z.
dc.contributor.authorWilson, Z. H.
dc.date.accessioned2021-10-01T09:51:45Z
dc.date.available2021-10-01T09:51:45Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3167
dc.sourceIIOimport
dc.titleMicrostructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy
dc.typeJournal article
dc.contributor.imecauthorBender, Hugo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage61
dc.source.endpage66
dc.source.journalNuclear Instruments and Methods. B
dc.source.issue1_2
dc.source.volume42
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
2415.pdf
Size:
615.3Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record