dc.contributor.author | Rzepa, Gerhard | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Subirats, Alexandre | |
dc.contributor.author | Simicic, Marko | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Jech, M. | |
dc.contributor.author | Knobloch, T. | |
dc.contributor.author | Waltl, M. | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Grasser, T. | |
dc.date.accessioned | 2021-10-26T02:57:23Z | |
dc.date.available | 2021-10-26T02:57:23Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31695 | |
dc.source | IIOimport | |
dc.title | COMPHY - A compact-physics framework for unified modeling of BTI | |
dc.type | Journal article | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Simicic, Marko | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 49 | |
dc.source.endpage | 65 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.volume | 85 | |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0026271418301641 | |
imec.availability | Published - imec | |