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Microwave characterization of Ba-substituted PZT and ZnO thin films

dc.contributor.authorTierno, Davide
dc.contributor.authorDekkers, Matthijn
dc.contributor.authorWittendorp, Paul
dc.contributor.authorSun, Xiao
dc.contributor.authorBayer, Samuel C.
dc.contributor.authorKing, Seth T.
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorHeyns, Marc
dc.contributor.authorRadu, Iuliana
dc.contributor.authorAdelmann, Christoph
dc.date.accessioned2021-10-26T05:40:41Z
dc.date.available2021-10-26T05:40:41Z
dc.date.issued2018
dc.identifier.issn0885-3010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31947
dc.sourceIIOimport
dc.titleMicrowave characterization of Ba-substituted PZT and ZnO thin films
dc.typeJournal article
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorSun, Xiao
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.source.peerreviewyes
dc.source.beginpage881
dc.source.endpage888
dc.source.journalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
dc.source.issue5
dc.source.volume65
dc.identifier.urlhttps://doi.org/10.1109/TUFFC.2018.2812424
imec.availabilityPublished - imec


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