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dc.contributor.authorVasiliev, Anton
dc.contributor.authorMuneeb, Muhammad
dc.contributor.authorAllaert, Jeroen
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorBaets, Roel
dc.contributor.authorRoelkens, Gunther
dc.date.accessioned2021-10-26T08:08:04Z
dc.date.available2021-10-26T08:08:04Z
dc.date.issued2018-11
dc.identifier.issn1077-260X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32162
dc.sourceIIOimport
dc.titleIntegrated silicon-on-insulator spectrometer with single pixel readout for mid-infrared spectroscopy
dc.typeJournal article
dc.contributor.imecauthorVasiliev, Anton
dc.contributor.imecauthorMuneeb, Muhammad
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage8300207
dc.source.journalIEEE Journal of Selected Topics in Quantum Electronics
dc.source.issue6
dc.source.volume24
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8327490/
imec.availabilityPublished - open access


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