dc.contributor.author | Verreck, Devin | |
dc.contributor.author | Arutchelvan, Goutham | |
dc.contributor.author | Lockhart de la Rosa, Cesar Javier | |
dc.contributor.author | Leonhardt, Alessandra | |
dc.contributor.author | Chiappe, Daniele | |
dc.contributor.author | Lu, Augustin | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | Radu, Iuliana | |
dc.date.accessioned | 2021-10-26T08:34:40Z | |
dc.date.available | 2021-10-26T08:34:40Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32198 | |
dc.source | IIOimport | |
dc.title | The role of nonidealities in the scaling of MoS2 FETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Verreck, Devin | |
dc.contributor.imecauthor | Arutchelvan, Goutham | |
dc.contributor.imecauthor | Lockhart de la Rosa, Cesar Javier | |
dc.contributor.imecauthor | Leonhardt, Alessandra | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4635 | |
dc.source.endpage | 4640 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 10 | |
dc.source.volume | 65 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8450639 | |
imec.availability | Published - open access | |