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In-situ ATR-FTIR for dynamic analysis of superhydrophobic breakdown on nanostructured silicon surfaces

dc.contributor.authorVrancken, Nandi
dc.contributor.authorLi, Jiaqi
dc.contributor.authorSergeant, Stefanie
dc.contributor.authorVereecke, Guy
dc.contributor.authorDoumen, Geert
dc.contributor.authorHolsteyns, Frank
dc.contributor.authorChen, Chang
dc.contributor.authorTerryn, Herman
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorXu, XiuMei
dc.date.accessioned2021-10-26T08:55:36Z
dc.date.available2021-10-26T08:55:36Z
dc.date.issued2018
dc.identifier.issn2045-2322
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32227
dc.sourceIIOimport
dc.titleIn-situ ATR-FTIR for dynamic analysis of superhydrophobic breakdown on nanostructured silicon surfaces
dc.typeJournal article
dc.contributor.imecauthorVrancken, Nandi
dc.contributor.imecauthorSergeant, Stefanie
dc.contributor.imecauthorVereecke, Guy
dc.contributor.imecauthorDoumen, Geert
dc.contributor.imecauthorHolsteyns, Frank
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorXu, XiuMei
dc.contributor.orcidimecSergeant, Stefanie::0000-0001-9923-0903
dc.contributor.orcidimecVereecke, Guy::0000-0001-9058-9338
dc.contributor.orcidimecDoumen, Geert::0000-0002-8029-7507
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.contributor.orcidimecXu, XiuMei::0000-0002-3356-8693
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage11637
dc.source.journalScientific Reports
dc.source.volume8
dc.identifier.urlhttps://doi.org/10.1038/s41598-018-30057-w
imec.availabilityPublished - open access


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