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Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorKraak, Daniel
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-27T07:25:13Z
dc.date.available2021-10-27T07:25:13Z
dc.date.issued2019
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32409
dc.sourceIIOimport
dc.titleSense amplifier offset voltage analysis for both time-zero and time-dependent variability
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage52
dc.source.endpage61
dc.source.journalMicroelectronics Reliability
dc.source.volume99
dc.identifier.urlhttps://doi.org/10.1016/j.microrel.2019.03.009
imec.availabilityPublished - imec


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