dc.contributor.author | Alam, Md Nur Kutubul | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Popovici, Mihaela Ioana | |
dc.contributor.author | Rzepa, Gerhard | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-27T07:25:28Z | |
dc.date.available | 2021-10-27T07:25:28Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 2168-6734 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32418 | |
dc.source | IIOimport | |
dc.title | On the characterization and separation of trapping and ferroelectric behavior in HfZrO FET | |
dc.type | Journal article | |
dc.contributor.imecauthor | Alam, Md Nur Kutubul | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 855 | |
dc.source.endpage | 862 | |
dc.source.journal | IEEE Journal of the Electron Devices Society | |
dc.source.volume | 7 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8667000 | |
imec.availability | Published - open access | |