dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Cott, Daire | |
dc.contributor.author | Boccardi, Guillaume | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Wostyn, Kurt | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Suhard, Samuel | |
dc.contributor.author | van Dorp, Dennis | |
dc.contributor.author | Dekkers, Harold | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | De Heyn, Vincent | |
dc.contributor.author | Mocuta, Dan | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Horiguchi, Naoto | |
dc.date.accessioned | 2021-10-27T07:27:05Z | |
dc.date.available | 2021-10-27T07:27:05Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32453 | |
dc.source | IIOimport | |
dc.title | Record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation | |
dc.type | Journal article | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Cott, Daire | |
dc.contributor.imecauthor | Boccardi, Guillaume | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Wostyn, Kurt | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Suhard, Samuel | |
dc.contributor.imecauthor | van Dorp, Dennis | |
dc.contributor.imecauthor | Dekkers, Harold | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | De Heyn, Vincent | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Boccardi, Guillaume::0000-0003-3226-4572 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Wostyn, Kurt::0000-0003-3995-0292 | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | van Dorp, Dennis::0000-0002-1085-4232 | |
dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 5387 | |
dc.source.endpage | 5392 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 12 | |
dc.source.volume | 66 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8897623 | |
imec.availability | Published - imec | |