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dc.contributor.authorBao, Xiue
dc.contributor.authorBao, Juncheng
dc.contributor.authorOcket, Ilja
dc.contributor.authorLiu, Song
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorKil, Dries
dc.contributor.authorLiu, Zhuangzhuang
dc.contributor.authorZhang, Meng
dc.contributor.authorPuers, Bob
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-27T07:29:34Z
dc.date.available2021-10-27T07:29:34Z
dc.date.issued2019
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32491
dc.sourceIIOimport
dc.titleA simplified dielectric material characterization algorithm for both liquids and solids
dc.typeJournal article
dc.contributor.imecauthorOcket, Ilja
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorKil, Dries
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorNauwelaers, Bart
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1639
dc.source.endpage1646
dc.source.journalIEEE Transactions on Electromagnetic Compatibility
dc.source.issue5
dc.source.volume61
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8458192
imec.availabilityPublished - open access


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