Electromigration Mechanisms in Scaled Interconnects
dc.contributor.author | Beyne, Sofie | |
dc.date.accessioned | 2021-10-27T07:33:49Z | |
dc.date.available | 2021-10-27T07:33:49Z | |
dc.date.issued | 2019-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32534 | |
dc.source | IIOimport | |
dc.title | Electromigration Mechanisms in Scaled Interconnects | |
dc.type | PHD thesis | |
dc.contributor.imecauthor | Beyne, Sofie | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.contributor.thesisadvisor | De Wolf, Ingrid | |
dc.contributor.thesisadvisor | Verlinden, A. | |
imec.availability | Published - open access |