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Analog performance and its variability in sub-10 nm fin-width FinFETs: a detailed analysis

dc.contributor.authorBhoir, Mandar S.
dc.contributor.authorChiarella, Thomas
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorMitard, Jerome
dc.contributor.authorTerzieva, Valentina
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorMohapatra, Nihar R.
dc.date.accessioned2021-10-27T07:35:04Z
dc.date.available2021-10-27T07:35:04Z
dc.date.issued2019
dc.identifier.issn2168-6734
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32545
dc.sourceIIOimport
dc.titleAnalog performance and its variability in sub-10 nm fin-width FinFETs: a detailed analysis
dc.typeJournal article
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorTerzieva, Valentina
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1217
dc.source.endpage1224
dc.source.journalIEEE Journal of the Electron Devices Society
dc.source.volume7
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8794627
imec.availabilityPublished - open access


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