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dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorVerhulst, Anne
dc.contributor.authorVerreck, Devin
dc.contributor.authorSoree, Bart
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-27T07:37:09Z
dc.date.available2021-10-27T07:37:09Z
dc.date.issued2019
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32562
dc.sourceIIOimport
dc.titleLarge variation in temperature dependence of band-to-band tunneling current in tunnel devices
dc.typeJournal article
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1864
dc.source.endpage1867
dc.source.journalIEEE Electron Device Letters
dc.source.issue11
dc.source.volume40
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8825821
imec.availabilityPublished - open access


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