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The Atomic Force Microscopy for Nanoelectronics

dc.contributor.authorCelano, Umberto
dc.date.accessioned2021-10-27T07:53:45Z
dc.date.available2021-10-27T07:53:45Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32664
dc.sourceIIOimport
dc.titleThe Atomic Force Microscopy for Nanoelectronics
dc.typeBook chapter
dc.contributor.imecauthorCelano, Umberto
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.bookElectrical AFM for nanoelectronics
dc.source.endpage28
dc.identifier.urlhttps://www.springer.com/gp/book/9783030156114
imec.availabilityPublished - imec


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