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Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorWood, Sebastian
dc.contributor.authorBlakesley, James C.
dc.contributor.authorFavia, Paola
dc.contributor.authorCelano, Umberto
dc.contributor.authorParedis, Kristof
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorCastro, Fernando A.
dc.date.accessioned2021-10-27T08:02:28Z
dc.date.available2021-10-27T08:02:28Z
dc.date.issued2019
dc.identifier.issn2158-3226
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32707
dc.sourceIIOimport
dc.titleNanoscale 3D characterisation of soft organic material using conductive scanning probe tomography
dc.typeJournal article
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage25105
dc.source.journalAIP Advances
dc.source.issue2
dc.source.volume9
dc.identifier.urlhttps://doi.org/10.1063/1.5066458
imec.availabilityPublished - open access


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