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The maximum a posteriori probability rule for atom column detection from HAADF STEM images

dc.contributor.authorFatermans, J.
dc.contributor.authorVan Aert, Sandra
dc.contributor.authorden Dekker, Arnold-Jan
dc.date.accessioned2021-10-27T09:09:15Z
dc.date.available2021-10-27T09:09:15Z
dc.date.issued2019-06
dc.identifier.issn0304-3991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32951
dc.sourceIIOimport
dc.titleThe maximum a posteriori probability rule for atom column detection from HAADF STEM images
dc.typeJournal article
dc.source.peerreviewyes
dc.source.beginpage81
dc.source.endpage91
dc.source.journalUltramicroscopy
dc.source.volume201
dc.identifier.urlhttps://doi.org/10.1016/j.ultramic.2019.02.003
imec.availabilityPublished - imec


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