Show simple item record

p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates

dc.contributor.authorClaeys, Cor
dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCzerwinski, A.
dc.contributor.authorKatcki, J.
dc.date.accessioned2021-10-06T10:47:59Z
dc.date.available2021-10-06T10:47:59Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3296
dc.sourceIIOimport
dc.titlep-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1151
dc.source.endpage1157
dc.source.journalJ. Electrochem. Soc.
dc.source.issue3
dc.source.volume146
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record