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Self-focusing SIMS

dc.contributor.authorFranquet, Alexis
dc.date.accessioned2021-10-27T09:20:01Z
dc.date.available2021-10-27T09:20:01Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32982
dc.sourceIIOimport
dc.titleSelf-focusing SIMS
dc.typeBook chapter
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage29
dc.source.bookDynamic Secondary Ion Mass Spectrometry
dc.source.endpage31
dc.identifier.urlhttps://www.essentialknowledgebriefings.com/dynamic-secondary-ion-mass-spectrometry/
imec.availabilityPublished - open access
imec.internalnotesEssential Knowledge Briefings


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