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Diamond Probes Technology

dc.contributor.authorHantschel, Thomas
dc.contributor.authorConard, Thierry
dc.contributor.authorKilpatrick, Jason
dc.contributor.authorCross, Graham
dc.date.accessioned2021-10-27T10:02:13Z
dc.date.available2021-10-27T10:02:13Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33093
dc.sourceIIOimport
dc.titleDiamond Probes Technology
dc.typeBook chapter
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorConard, Thierry
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewyes
dc.source.beginpage351
dc.source.bookElectrical Atomic Force Microscopy for Nanoelectronics
dc.source.endpage381
dc.identifier.urlhttps://www.springer.com/gp/book/9783030156114#aboutAuthors
imec.availabilityPublished - imec


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