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Investigation and comparison of the noise in the gate and substrate current after soft-breakdown

dc.contributor.authorCrupi, Felice
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorNigam, Tanya
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-06T10:51:05Z
dc.date.available2021-10-06T10:51:05Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3323
dc.sourceIIOimport
dc.titleInvestigation and comparison of the noise in the gate and substrate current after soft-breakdown
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage2219
dc.source.endpage2222
dc.source.journalJapanese Journal of Applied Physics. Part 1: Regular Papers
dc.source.issue4B
dc.source.volume38
imec.availabilityPublished - imec


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