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dc.contributor.authorKhaled, Ahmad
dc.date.accessioned2021-10-27T11:19:04Z
dc.date.available2021-10-27T11:19:04Z
dc.date.issued2019-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33274
dc.sourceIIOimport
dc.titleExploration of GHz-scanning acoustic microscopy for failure analysis of innovative silicon technologies
dc.typePHD thesis
dc.contributor.imecauthorKhaled, Ahmad
dc.contributor.orcidimecKhaled, Ahmad::0000-0003-2892-3176
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorDe Wolf, Ingrid
dc.contributor.thesisadvisorWevers, Martine
imec.availabilityPublished - open access


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