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Study of breakdown effects in silicon multiguard structures

dc.contributor.authorDa Rold, Martina
dc.contributor.authorBacchetta, N.
dc.contributor.authorBisello, D.
dc.contributor.authorPaccagnella, A.
dc.contributor.authorDalla Betta, G. F.
dc.contributor.authorVerzellesi, G.
dc.contributor.authorMilitaru, O.
dc.contributor.authorWheadon, R.
dc.contributor.authorFuochi, P. G.
dc.contributor.authorBozzi, C.
dc.contributor.authorDell'Orso, R.
dc.contributor.authorMessineo, A.
dc.contributor.authorTonelli, G.
dc.contributor.authorVerdini, P. G.
dc.date.accessioned2021-10-06T10:51:42Z
dc.date.available2021-10-06T10:51:42Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3328
dc.sourceIIOimport
dc.titleStudy of breakdown effects in silicon multiguard structures
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1215
dc.source.endpage1223
dc.source.journalIEEE Trans. Nuclear Science
dc.source.issue4, Pt.3
dc.source.volume46
imec.availabilityPublished - imec


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