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High-sensitivity Rutherford backscattering spectrometry employing an analyzing magnet and silicon strip detector

dc.contributor.authorLaricchiuta, Grazia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorMeersschaut, Johan
dc.date.accessioned2021-10-27T12:06:22Z
dc.date.available2021-10-27T12:06:22Z
dc.date.issued2019
dc.identifier.issn0168-583X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33373
dc.sourceIIOimport
dc.titleHigh-sensitivity Rutherford backscattering spectrometry employing an analyzing magnet and silicon strip detector
dc.typeJournal article
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.source.peerreviewyes
dc.source.beginpage59
dc.source.endpage63
dc.source.journalNuclear Instruments and Methods in Physics Research B
dc.source.volume439
dc.identifier.urlhttps://doi.org/10.1016/j.nimb.2018.10.042
imec.availabilityPublished - imec


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