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DX center breakdown in high electric fields

dc.contributor.authorDargys, A.
dc.contributor.authorZurauskiene, N.
dc.contributor.authorGoovaerts, E.
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-06T10:52:54Z
dc.date.available2021-10-06T10:52:54Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3338
dc.sourceIIOimport
dc.titleDX center breakdown in high electric fields
dc.typeProceedings paper
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorBorghs, Gustaaf
dc.source.peerreviewno
dc.source.beginpage25
dc.source.endpage28
dc.source.conferenceUltrafast Phenomena in Semiconductors; Proceedings of the 10th Int. Symp. on Ultrafast Phenomena in Semiconductors; August-Sept.
imec.availabilityPublished - imec


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