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Machine learning based error detection in transient susceptibility tests

dc.contributor.authorMedico, Roberto
dc.contributor.authorLambrecht, Niels
dc.contributor.authorPues, Hugo
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.contributor.authorSpina, Domenico
dc.date.accessioned2021-10-27T13:45:31Z
dc.date.available2021-10-27T13:45:31Z
dc.date.issued2019-04
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33562
dc.sourceIIOimport
dc.titleMachine learning based error detection in transient susceptibility tests
dc.typeJournal article
dc.contributor.imecauthorMedico, Roberto
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorSpina, Domenico
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage352
dc.source.endpage360
dc.source.journalIEEE Transactions on Electromagnetic Compatibility
dc.source.issue2
dc.source.volume61
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8367843
imec.availabilityPublished - open access


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