dc.contributor.author | Mortelmans, Wouter | |
dc.contributor.author | El Kazzi, Salim | |
dc.contributor.author | Nalin Mehta, Ankit | |
dc.contributor.author | Vanhaeren, Danielle | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Meersschaut, Johan | |
dc.contributor.author | Nuytten, Thomas | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Merckling, Clement | |
dc.date.accessioned | 2021-10-27T14:22:26Z | |
dc.date.available | 2021-10-27T14:22:26Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0957-4484 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33627 | |
dc.source | IIOimport | |
dc.title | Peculiar alignment and strain behavior of 2D WSe2 monolayers grown by van der Waals epitaxy on engineered sapphire surfaces | |
dc.type | Journal article | |
dc.contributor.imecauthor | Mortelmans, Wouter | |
dc.contributor.imecauthor | Nalin Mehta, Ankit | |
dc.contributor.imecauthor | Vanhaeren, Danielle | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Meersschaut, Johan | |
dc.contributor.imecauthor | Nuytten, Thomas | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.orcidimec | Nalin Mehta, Ankit::0000-0002-2169-940X | |
dc.contributor.orcidimec | Vanhaeren, Danielle::0000-0001-8624-9533 | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | Meersschaut, Johan::0000-0003-2467-1784 | |
dc.contributor.orcidimec | Nuytten, Thomas::0000-0002-5921-6928 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 465601 | |
dc.source.endpage | 465611 | |
dc.source.journal | Nanotechnology | |
dc.source.issue | 46 | |
dc.source.volume | 30 | |
dc.identifier.url | https://doi.org/10.1088/1361-6528/ab3c9b | |
imec.availability | Published - open access | |