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Ground plane impact on performance of relaxed Ge FinFETs

dc.contributor.authorOliviera, Alberto
dc.contributor.authorGoncalves, Guilherme
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, Joao
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorMitard, Jerome
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-27T15:01:11Z
dc.date.available2021-10-27T15:01:11Z
dc.date.issued2019
dc.identifier.issn1807-1953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33693
dc.sourceIIOimport
dc.titleGround plane impact on performance of relaxed Ge FinFETs
dc.typeJournal article
dc.contributor.imecauthorGoncalves, Guilherme
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.journalJournal of Integrated Circuits and Systems
dc.source.issue1
dc.source.volume14
dc.identifier.urlhttps://doi.org/10.29292/jics.v14i1.55
imec.availabilityPublished - open access
imec.internalnotesSelected Papers from 33rd Symposium on Microelectronics Technology and Devices


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