dc.contributor.author | Putcha, Vamsi | |
dc.date.accessioned | 2021-10-27T16:28:45Z | |
dc.date.available | 2021-10-27T16:28:45Z | |
dc.date.issued | 2019-02 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33836 | |
dc.source | IIOimport | |
dc.title | Reliability characterization of gate-stacks for III-V channel MOSFETs | |
dc.type | PHD thesis | |
dc.contributor.imecauthor | Putcha, Vamsi | |
dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.contributor.thesisadvisor | Groeseneken, Guido | |
dc.identifier.url | https://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS2363730&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1 | |
imec.availability | Published - open access | |