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Voids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microsccopy analyses

dc.contributor.authorRibeiro-Andrade, Rodrigo
dc.contributor.authorSahayaraj, Sylvester
dc.contributor.authorVermang, Bart
dc.contributor.authorRosario Correia, M.
dc.contributor.authorSadewasser, Sascha
dc.contributor.authorGonzalez, Juan Carlos
dc.contributor.authorFernandes, Paulo A.
dc.contributor.authorSalomé, Pedro M.P.
dc.date.accessioned2021-10-27T17:05:34Z
dc.date.available2021-10-27T17:05:34Z
dc.date.issued2019
dc.identifier.issn2156-3381
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33892
dc.sourceIIOimport
dc.titleVoids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microsccopy analyses
dc.typeJournal article
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage565
dc.source.endpage570
dc.source.journalIEEE Journal of Photovoltaics
dc.source.issue2
dc.source.volume9
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8610192
imec.availabilityPublished - open access


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