dc.contributor.author | Sanctorum, J. G. | |
dc.contributor.author | Adriaens, D. | |
dc.contributor.author | Dirckx, J. J. J. | |
dc.contributor.author | Sijbers, Jan | |
dc.contributor.author | Van Ginneken, C. | |
dc.contributor.author | Aerts, P. | |
dc.contributor.author | Van Wassenbergh, S | |
dc.date.accessioned | 2021-10-27T17:32:35Z | |
dc.date.available | 2021-10-27T17:32:35Z | |
dc.date.issued | 2019-08 | |
dc.identifier.issn | 0957-0233 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33934 | |
dc.source | IIOimport | |
dc.title | Methods for characterization and optimisation of measuring performance of stereoscopic x-ray systems with image intensifiers | |
dc.type | Journal article | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 105701 | |
dc.source.journal | Measurement Science and Technology | |
dc.source.issue | 10 | |
dc.source.volume | 30 | |
dc.identifier.url | https://iopscience.iop.org/article/10.1088/1361-6501/ab23e7 | |
imec.availability | Published - imec | |