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dc.contributor.authorScandurra, Graziella
dc.contributor.authorBeyne, Sofie
dc.contributor.authorGiusi, Gino
dc.contributor.authorCiofi, Carmine
dc.date.accessioned2021-10-27T17:38:51Z
dc.date.available2021-10-27T17:38:51Z
dc.date.issued2019
dc.identifier.issn0860-8229
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33944
dc.sourceIIOimport
dc.titleOn the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
dc.typeJournal article
dc.contributor.imecauthorBeyne, Sofie
dc.source.peerreviewyes
dc.source.beginpage13
dc.source.endpage21
dc.source.journalMetrology and Measurement Systems
dc.source.issue1
dc.source.volume26
dc.identifier.urlhttp://www.czasopisma.pan.pl/Content/110249/PDF/art_02.pdf
imec.availabilityPublished - imec


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