On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
dc.contributor.author | Scandurra, Graziella | |
dc.contributor.author | Beyne, Sofie | |
dc.contributor.author | Giusi, Gino | |
dc.contributor.author | Ciofi, Carmine | |
dc.date.accessioned | 2021-10-27T17:38:51Z | |
dc.date.available | 2021-10-27T17:38:51Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0860-8229 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33944 | |
dc.source | IIOimport | |
dc.title | On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements | |
dc.type | Journal article | |
dc.contributor.imecauthor | Beyne, Sofie | |
dc.source.peerreview | yes | |
dc.source.beginpage | 13 | |
dc.source.endpage | 21 | |
dc.source.journal | Metrology and Measurement Systems | |
dc.source.issue | 1 | |
dc.source.volume | 26 | |
dc.identifier.url | http://www.czasopisma.pan.pl/Content/110249/PDF/art_02.pdf | |
imec.availability | Published - imec |
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