Show simple item record

Mapping conductance and carrier distributions in confined three-dimensional transistor structures

dc.contributor.authorSchulze, Andreas
dc.contributor.authorEyben, Pierre
dc.contributor.authorMody, Jay
dc.contributor.authorParedis, Kristof
dc.contributor.authorWouters, Lennaert
dc.contributor.authorCelano, Umberto
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-27T17:47:20Z
dc.date.available2021-10-27T17:47:20Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33957
dc.sourceIIOimport
dc.titleMapping conductance and carrier distributions in confined three-dimensional transistor structures
dc.typeBook chapter
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewyes
dc.source.beginpage71
dc.source.bookElectrical Atomic Force Microscopy for Nanoelectronics
dc.source.endpage106
dc.identifier.urlhttps://doi.org/10.1007/978-3-030-15612-1_3
imec.availabilityPublished - imec
imec.internalnotesNanoScience and Technology book series (NANO)


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record