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Experimental evaluation of self-heating and analog/RF FOM in GAA-nanowire FETs

dc.contributor.authorSingh, Ramendra
dc.contributor.authorAditya, Kritika
dc.contributor.authorVeloso, Anabela
dc.contributor.authorParvais, Bertrand
dc.contributor.authorDixit, Abhishek
dc.date.accessioned2021-10-27T18:25:42Z
dc.date.available2021-10-27T18:25:42Z
dc.date.issued2019
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34014
dc.sourceIIOimport
dc.titleExperimental evaluation of self-heating and analog/RF FOM in GAA-nanowire FETs
dc.typeJournal article
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3279
dc.source.endpage3285
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue8
dc.source.volume66
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8758332
imec.availabilityPublished - open access


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