dc.contributor.author | Tallarico, Andrea | |
dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | Posthuma, Niels | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Sangiorgi, E | |
dc.contributor.author | Fiegna, C | |
dc.date.accessioned | 2021-10-27T19:24:22Z | |
dc.date.available | 2021-10-27T19:24:22Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34101 | |
dc.source | IIOimport | |
dc.title | Gate reliability of p-GaN HEMT with gate metal retraction | |
dc.type | Journal article | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | Posthuma, Niels | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Posthuma, Niels::0000-0002-6029-1909 | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4829 | |
dc.source.endpage | 4835 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 11 | |
dc.source.volume | 66 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8842623 | |
imec.availability | Published - imec | |