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Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

dc.contributor.authorvan Dael, M.
dc.contributor.authorVerboven, P.
dc.contributor.authorZanella, A.
dc.contributor.authorSijbers, Jan
dc.contributor.authorNicolai, B.
dc.date.accessioned2021-10-27T20:19:59Z
dc.date.available2021-10-27T20:19:59Z
dc.date.issued2019
dc.identifier.issn0925-5214
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34181
dc.sourceIIOimport
dc.titleCombination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
dc.typeJournal article
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage218
dc.source.endpage227
dc.source.journalPostharvest Biology and Technology
dc.source.volume148
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0925521418300565
imec.availabilityPublished - imec


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