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A mission profle-based reliability analysis framwork for photovoltaic DC-DC converters

dc.contributor.authorVan De Sande, Wieland
dc.contributor.authorRavyts, S.
dc.contributor.authorSangwongwanich, A.
dc.contributor.authorManganiello, Patrizio
dc.contributor.authorYang, Y.
dc.contributor.authorBlaabjerg, F.
dc.contributor.authorDriesen, J.
dc.contributor.authorDaenen, Michaël
dc.date.accessioned2021-10-27T20:23:30Z
dc.date.available2021-10-27T20:23:30Z
dc.date.issued2019
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34186
dc.sourceIIOimport
dc.titleA mission profle-based reliability analysis framwork for photovoltaic DC-DC converters
dc.typeJournal article
dc.contributor.imecauthorVan De Sande, Wieland
dc.contributor.imecauthorManganiello, Patrizio
dc.contributor.imecauthorDaenen, Michaël
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage113383
dc.source.journalMicroelectronics Reliability
dc.source.volume100-101
dc.identifier.urlhttps://doi.org/10.1016/j.microrel.2019.06.075
imec.availabilityPublished - open access
imec.internalnotesSpecial issue ESREF 2019


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