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APT tip shape modifications during analysis, its implications, and the potential to measure tip shapes in real time via soft-X-ray ptychography

dc.contributor.authorvan der Heide, Paul
dc.contributor.authorMakhotkin, Igor
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorFleischmann, Claudia
dc.date.accessioned2021-10-27T20:33:50Z
dc.date.available2021-10-27T20:33:50Z
dc.date.issued2019
dc.identifier.issn1431-9276
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34201
dc.sourceIIOimport
dc.titleAPT tip shape modifications during analysis, its implications, and the potential to measure tip shapes in real time via soft-X-ray ptychography
dc.typeJournal article
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorMakhotkin, Igor
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.source.peerreviewyes
dc.source.beginpage2504
dc.source.endpage2505
dc.source.journalMicroscopy and Microanalysis
dc.source.issueS2
dc.source.volume25
dc.identifier.urlhttps://doi.org/10.1017/S1431927619013254
imec.availabilityPublished - imec


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