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Data-efficient sensitivity analysis with surrogate modeling

dc.contributor.authorVan Steenkiste, Tom
dc.contributor.authorvan der Herten, Joachim
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorDhaene, Tom
dc.date.accessioned2021-10-27T21:26:29Z
dc.date.available2021-10-27T21:26:29Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34276
dc.sourceIIOimport
dc.titleData-efficient sensitivity analysis with surrogate modeling
dc.typeBook chapter
dc.contributor.imecauthorVan Steenkiste, Tom
dc.contributor.imecauthorvan der Herten, Joachim
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage55
dc.source.bookUncertainty Modeling for Engineering Applications
dc.source.endpage69
dc.identifier.urlhttps://doi.org/10.1007/978-3-030-04870-9
imec.availabilityPublished - open access
imec.internalnotesPoliTO Springer Series (PTSS)


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