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ALBATROS: adaptive line-based sampling trajectories for sequential measurements

dc.contributor.authorVan Steenkiste, Tom
dc.contributor.authorvan der Herten, Joachim
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.date.accessioned2021-10-27T21:27:11Z
dc.date.available2021-10-27T21:27:11Z
dc.date.issued2019-04
dc.identifier.issn0177-0667
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34277
dc.sourceIIOimport
dc.titleALBATROS: adaptive line-based sampling trajectories for sequential measurements
dc.typeJournal article
dc.contributor.imecauthorVan Steenkiste, Tom
dc.contributor.imecauthorvan der Herten, Joachim
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage537
dc.source.endpage550
dc.source.journalEngineering with Computers
dc.source.issue2
dc.source.volume35
dc.identifier.urlhttps://doi.org/10.1007/s00366-018-0614-6
imec.availabilityPublished - open access


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